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Figure 1 | EPJ Techniques and Instrumentation

Figure 1

From: Photothermal cantilever deflection spectroscopy

Figure 1

Schematic illustration of the experimental setup. Orthogonal signals (nanomechanical IR spectra and mass variations) are measured by optical beam deflection method using a red diode laser and a position sensitive detector (PSD). These nonradiative decay processes result in heating up the bi-material cantilever, generating the deflection of the cantilever.

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