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Fig. 10 | EPJ Techniques and Instrumentation

Fig. 10

From: Tip-enhanced Raman spectroscopy: principles and applications

Fig. 10

Visualising graphene edge using TERS. a AFM lateral force image and (b) TERS map of the D-peak intensity of a single-layer graphene flake. c TER spectra corresponding to the points marked with circle (centre of the flake), star (edge of the flake) and triangle (glass substrate) in (b). d (open circles) TERS D-peak intensity profile at the edge of the flake, averaged in the rectangular area marked in (b), (solid line) calculated D-peak intensity spatial profile showing spatial width of 18.2 nm. Reprinted with permission from reference [13], Copyright 2013, American Vacuum Society

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