Fig. 10From: Tip-enhanced Raman spectroscopy: principles and applicationsVisualising graphene edge using TERS. a AFM lateral force image and (b) TERS map of the D-peak intensity of a single-layer graphene flake. c TER spectra corresponding to the points marked with circle (centre of the flake), star (edge of the flake) and triangle (glass substrate) in (b). d (open circles) TERS D-peak intensity profile at the edge of the flake, averaged in the rectangular area marked in (b), (solid line) calculated D-peak intensity spatial profile showing spatial width of 18.2Â nm. Reprinted with permission from reference [13], Copyright 2013, American Vacuum SocietyBack to article page