Skip to main content


Fig. 8 | EPJ Techniques and Instrumentation

Fig. 8

From: An interferometric force probe for beam diagnostics and the study of sputtering

Fig. 8

Measurements at different angles of incidence. a Diplacements measured by the two sensors, b calculated normal and in-plane force coordinates of the same data. The forces are caused by a 1.2 keV Ar/Ar + beam impacting on a copper (Cu) and a carbon fiber velvet target (CFV). The calculated solid and dashed lines indicate the theoretical case of ideal absorption (I.A.) without sputtering. For the sake of legibility, only every fifth error bar is plottet

Back to article page