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EPJ Techniques and Instrumentation
Fig. 14 | EPJ Techniques and Instrumentation

Fig. 14

From: The aerosol impact spectrometer: a versatile platform for studying the velocity dependence of nanoparticle-surface impact phenomena

Fig. 14

Coefficient of restitution data for 990 nm PSLs at normal incidence on silicon, presented with incident velocity grouped in 4 m/s bins then averaged (mean), black circles. Any data outside of one standard deviation from the mean for each bin were removed. Created from 3592 measured events. The data are compared to data reported by Dahneke (red circles) in ref. [53] for 1.27 μm PSLs at normal incidence on fused silica

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